test_mm_sc_drf_01: Testing SC-DRF non-atomic global read and write within a locked mutex critical block.
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test_mm_sc_drf_01: Testing SC-DRF non-atomic global read and write within a locked mutex critical block.
Modified non-atomic memory within the locked mutex acquire and release block, must be visible for all threads according to memory model (MM) Sequentially Consistent (SC) being data-race-free (DRF).
See Herb Sutter's 2013-12-23 slides p19, first box "It must be impossible for the assertion to fail – wouldn’t be SC.".
See 'test_mm_sc_drf_00' implementing same test using an atomic acquire/release critical block with spin-lock.
- Examples
- test_mm_sc_drf_01.cpp.
Definition at line 57 of file test_mm_sc_drf_01.cpp.